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It is well known that epoxy moulding compound (EMC) plays an important role in the reliability of electronic packages. In order to predict the mechanical behaviour of electronic packages that are encapsulated with moulding compound, the material properties of EMCs should be carefully characterized and modelled. Currently, more and more components are exposed to severe environments. Among these, high...
Thermoset-based adhesives are used as thermal and electrical interfaces. These adhesives are filled with different particles in order to meet the requirements of heat transfer and electrical properties. In automotive applications, they are required to have excellent adhesion since bulk cracking and/or delamination may precipitate other electrical, thermal or mechanical failure mechanisms. With the...
Electrically conductive adhesives are widely used in semiconductor technology. The focus of this work is set on Isotropic Conductive Adhesives (ICA) with a high amount of electrically conductive filler particles. The aim of this work is the material characterization of highly filled epoxy based die attaches materials by dynamic mechanical analysis (DMA) and relaxation experiments in order to derive...
Interfacial delamination is known as one of the root causes of failure in microelectronic industry and therefore is getting more and more attention. In order to be able for judging the risk of interface fracture, the critical fracture properties of the interfaces should be available i.e. Interfacial toughness. Interfacial toughness is strongly dependent on the temperature, the moisture content of...
Interfacial delamination is known as one of the root causes of failure in microelectronic industry and therefore is getting more and more attention. In order to be able for judging the risk of interface fracture, the critical fracture properties of the interfaces should be available i.e. Interfacial toughness. Interfacial toughness is strongly dependent on the temperature, the moisture content of...
Delamination in interfaces is one of the failure modes in microelectronic products. In order to be able for judging the risk of interface fracture, the critical interfacial fracture properties should be established. Moisture, temperature and mode mixity have significant effect on the interfacial toughness. Dealing with the moisture effect the highest temperature was limited to 100°C. This limitation...
The common features in dielectric and mechanical characteristics of the Epoxy Molding Compound (EMC) were found in temperature dependencies of the dielectric permittivity and the dielectric loss factor obtained in experiments by Electro-Dynamic Analysis (EDA) in comparison with the temperature dependence of storage modulus and mechanical loss factor in Dynamical Mechanical Analysis (DMA). Experimental...
Interfacial delamination has become one of the key reliability issues in the microelectronic industry and therefore is getting more and more attention. The analysis of delamination of a laminate structure with a crack along the interface is central to the characterization of the interfacial toughness. Interfacial toughness is highly dependent to temperature, moisture and mode mixity. The present study...
Numerical simulation plays an important role in product design. Its accuracy relays on a detailed description of geometry, material models, load and boundary conditions. This paper focuses on a new approach of FEM material modeling of three commercially available molding compounds. Curing shrinkage, modulus of elasticity and coefficient of thermal expansion were measured and implemented into commercially...
The traction-displacement relations of the epoxy-copper interfaces are studied using an atomistic model. The reaction force of the epoxy layer in response to displacement of the interface is calculated during molecular dynamics simulation. A parametric study in terms of displacement rate and the step size of displacement increment has been performed. The traction-displacement relations are found sensitive...
Warpage of flat packages is partly due to chemical shrinkage of the molding compound during cure and partly due to differences in thermal contraction in the subsequent cooling stage. The latter effect is relatively easy to incorporate in numerical simulations but the cure-induced shrinkage effect is not and is therefore often neglected in warpage simulations. Recent validation studies however showed...
Curing effects and difference in thermal contraction of components cause residual stresses and warpage during encapsulation of electronic packages. Residual stresses combined with thermal and mechanical loads influence package reliability and performance and may eventually lead to product failure. Comprehensive material characterisation is needed in order to perform numerical simulations which take...
Delamination of interfaces is known as one of the root causes of failure in microelectronic industry and therefore is getting more and more attention. In order to be able for judging the risk of the interface fracture, the critical fracture properties of the interfaces should be available i.e. Interfacial fracture toughness. Interfacial fracture toughness is highly dependent to temperature, moisture...
Microelectronic packages can be considered as composite structures fabricated from highly dissimilar materials. Interface delamination related failure often occurs when the packaged devices are subjected to thermo-mechanical loading. The analysis of delamination of a laminate structure with a crack along the interface is central to the characterization of interfacial toughness. Due to the mismatch...
The mechanical properties of polymer encapsulating materials change considerably when packages are exposed to elevated temperatures for longer times. Here we report a systematic study on the change in viscoelastic properties of a commercial molding compound which is stored at 175°C for periods of time ranging up to 4 weeks. It is shown that instead of the expected degradation, the modulus and the...
The rapid diversification in microelectronics forebodes more complex system integration, be it for denser function integration or a span of dimensions between various technologies. Products may include more features, perform faster and be cheaper. With these trends the amount of material layers is increasing. This challenges development to a faster rating of material pairings. Delamination is a major...
The present study deals with experimental investigation of the delamination toughness of EMC (epoxy molding compound) and Copper-leadframe interfaces. Test samples were directly obtained from the production line. EMC is attached on copper substrates with various surface treatments. Mixed mode bending experiments were performed under various temperature and moisture environments. The test procedure...
Interface delamination is one of the most important issues in the microelectronic packaging industry. Silver filled die attach is a typical adhesive used between the die and copper die pad for its improved heat dissipation capacity. Delamination between die attach and die pad will severely impact the heat conduction and result in product failure. In order to predict this delamination, interface properties...
An electronic device cannot perform its designed functions until it is packaged such that it is interconnected with the rest of the system and protected. As an encapsulation material, thermosetting polymers are widely used. It is well known that properties of polymer-based composites like molding compounds are highly affected by the influence of temperature, relative humidity and degree of conversion...
Summary form only given. The ever increasing complexity and function integration of microelectronic products in combination with the decreasing design margins, the decreasing time-to-market, and ever increasing gap between technology advance and fundamental knowledge opposes a severe challenge for the microelectronics industry to meet the quality, robustness, and reliability requirements of their...
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