Search results for: Cher Ming Tan
Thin Solid Films > 2008 > 516 > 23 > 8804-8809
Reliability Engineering and System Safety > 2008 > 93 > 8 > 1138-1150
2008 2nd IEEE International Nanoelectronics Conference > 1167 - 1186
Journal of Electronic Testing > 2008 > 24 > 5 > 473-479
Materials Science & Engineering R > 2007 > 58 > 1-2 > 1-75
Microelectronics Reliability > 2007 > 47 > 9-11 > 1555-1560
Microelectronics Reliability > 2007 > 47 > 9-11 > 1497-1501
Microelectronics Reliability > 2007 > 47 > 9-11 > 1580-1584
Microelectronics Reliability > 2007 > 47 > 9-11 > 1336-1342
Thin Solid Films > 2007 > 515 > 7-8 > 3867-3874
Microelectronics Reliability > 2006 > 46 > 9-11 > 1823-1827
Microelectronics Reliability > 2006 > 46 > 9-11 > 1638-1642