Search results for: M. Comte
IET Computers & Digital Techniques > 2007 > 1 > 3 > 146 - 153
IEEE Design & Test of Computers > 2006 > 23 > 3 > 234 - 243
Journal of Electronic Testing > 2005 > 21 > 3 > 291-298
Journal of Electronic Testing > 2004 > 20 > 3 > 257-267
Journal of Electronic Testing > 2004 > 20 > 4 > 375-387
Microelectronics Journal > 2003 > 34 > 10 > 945-953
Calculus of Variations and Partial Differential Equations > 2001 > 12 > 2 > 173-211