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We report high resolution, non-invasive, thermal and optical characterization of semiconductor optical amplifiers (SOAs) and SOA-based photonic integrated circuits (PICs) using thermoreflectance microscopy. Chip-scale temperature imaging of SOAs and PICs, along with an energy balance model, are used to calculate the optical power distribution within and between SOAs to determine optical gain, fiber...
The propagation characteristics of an electric arc on an ice surface have been investigated using high-speed imaging technique. The light emission in both UV and visible regions under ac voltage during the arc propagation has been recorded using an ultra high-speed camera and an image intensifier. The initiation and propagation of discharge in the air gap and along the ice surface were observed, and...
We demonstrate the use of amplified spontaneous emission in thermoreflectance imaging of photonic integrated circuits for fiber-free characterization of the integrated cascaded semiconductor optical amplifiers.
We demonstrate the use of thermoreflectance imaging for wafer-scale testing of photonic integrated circuits. The technique is used to identify damaged devices in a dysfunctional photonic circuit comprised of cascaded semiconductor optical amplifiers.
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