The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
An automated measuring system has been developed to improve the calibration of high value standard resistors in the meg-ohm range at the National Institute for Standards (NIS), Egypt. This system is suitable for the calibration of the standard resistors from 100kΩ to 100MΩ using the DMM-based method by the substitution technique where the unknown resistor and the standard resistor are indirectly compared...
This paper describes the procedures made at National Institute for Standards (NIS), Egypt to establish accurate resistance measurements for high value resistance standards in the range from 100kΩ to 100MΩ. Guarded Hamon transfer standards have been used at NIS for scaling to high resistance levels up to 100MΩ. The used method at NIS for the high resistance measurements, above 100kΩ, is the DMM-based...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.