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In this paper, we have developed a framework to study wearout of state-of-the-art microprocessor systems. Taking into account the detailed thermal and electrical stress profiles, which are determined by running benchmarks on the system, we present a methodology to accurately estimate the lifetime due to each mechanism. The lifetime-limiting blocks and paths of a circuit are highlighted using standard...
In this work, we perform a comparative study of different wearout mechanisms affecting the state-of-art microprocessor systems. Taking into account the detailed thermal and electrical stress profiles, we present a methodology to accurately estimate the lifetime due to each mechanism. The lifetime-limiting wearout mechanisms are highlighted using standard benchmarks along with the reliability-critical...
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