Search results for: Ming-Dou Ker
Microelectronics Reliability > 2017 > 78 > C > 258-266
Microelectronics Reliability > 2014 > 54 > 1 > 64-70
Microelectronics Reliability > 2014 > 54 > 1 > 71-78
Microelectronics Reliability > 2013 > 53 > 2 > 208-214
Microelectronics Reliability > 2012 > 52 > 11 > 2627-2631
Microelectronics Reliability > 2012 > 52 > 6 > 1020-1030
Microelectronics Reliability > 2011 > 51 > 8 > 1315-1324
Microelectronics Reliability > 2011 > 51 > 5 > 871-878
Microelectronics Reliability > 2010 > 50 > 6 > 821-830
Microelectronics Reliability > 2010 > 50 > 6 > 831-838
Microelectronics Reliability > 2010 > 50 > 1 > 48-56
Microelectronics Reliability > 2009 > 49 > 6 > 650-659
Microelectronics Reliability > 2007 > 47 > 9-11 > 1502-1505
Microelectronics Reliability > 2007 > 47 > 1 > 27-35
Microelectronics Reliability > 2006 > 46 > 12 > 2067-2073
Microelectronics Reliability > 2006 > 46 > 7 > 1042-1049
Microelectronics Reliability > 2006 > 46 > 2-4 > 301-310
Microelectronics Reliability > 2005 > 45 > 9-11 > 1311-1316
Microelectronics Reliability > 2004 > 44 > 2 > 213-221