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This paper presents a measurement scheme which can be used to detect the line defects in two dimensional (2D) materials such as graphene. With micro four point probe measurement, the sheet resistances of the material can be mapped in two directions. Therefore, the line defects with insulation boundaries can be illustrated by calculating the resistance ratio RA/RB. We have demonstrated the simulations...
Recently a novel microscale Hall effect measurement technique has been developed to extract sheet resistance (Rs), Hall sheet carrier density (NHs) and Hall mobility (μH) from collinear micro 4-point probe measurements in the vicinity of an insulating boundary [1]. The technique measures in less than a minute directly the local transport properties, which enables in-line production monitoring on scribe...
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