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This paper describes a thermal and power-supply tolerant design methodology for pipeline based circuits. It is shown that by making the circuit more tolerant to VDD and temperature (T) instability, even in the presence of process variations, a yield loss reduction is achieved. The goal is to improve signal integrity in the presence of power-supply voltage (VDD) and/or temperature (T) variations, without...
A new methodology is proposed to increase the robustness of pipeline-based circuits. The goal is to improve signal integrity in the presence of power-supply voltage (VDD) and/or temperature (T) variations, without degrading circuit performance. In the proposed methodology, we dynamically control the instant of data capture (the clock edge trigger) in key memory cells, according to local VDD and/or...
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