Search results for: S. Yamada
IEEE Transactions on Reliability > 2011 > 60 > 1 > 171 - 179
Computers and Mathematics with Applications > 2003 > 46 > 7 > 1155-1163
IEEE Transactions on Reliability > 2011 > 60 > 1 > 171 - 179
Computers and Mathematics with Applications > 2003 > 46 > 7 > 1155-1163