The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The semiconductor industry is encountering an increasing number of front-end-of-line defects in the advanced FinFET technology nodes due to extremely small feature size and complex manufacturing processes required for FinFET transistors. Traditional delay diagnosis algorithm has a limited support for cell internal timing related failures based on transition delay faults, and tends to provide a large...
The industry is encountering an increasing number of front-end-of-line defects in the most advanced technology nodes due to extremely small feature size and complex manufacturing processes. Traditional scan diagnosis algorithms can locate a defective cell by examining its excitation conditions for cell internal defects, but cannot provide the more precise defect location inside the cell that is necessary...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.