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Sliding probe methods are designed for the in situ characterization of electrical properties of individual 1-D nanostructures. The key to achieving a high resolution is to keep the contact resistance constant by controlling the contact force and area between the specimen and the sliding probe. We have developed several techniques and tools including differential sliding, flexible probes, and specimen-shape-adaptable...
We report an in situ experimental characterization method of nanoelectrochemical systems (NECSs). Experiments were performed using nanorobotic manipulation inside a transmission electron microscope together with an electrochemical work station. The electrochemical behavior of an Mg-MgO-MoS2 heterostructure demonstrated the potential application of Mg as an anode for an ion-battery. Due to the abundant...
We report the nanorobotic in situ forming and characterization of memristors based on individual copper oxide nanowires (CuO NWs) and their potential applications as nanosensors with memory (memristic sensors or “memsensors”). A series of in situ techniques for the experimental investigations of memristors are developed including nanorobotic manipulation, electro-beam-based forming, and electron energy...
Sliding probe methods are designed for the in situ electrical property characterization of individual one-dimensional (1D) nanostructures by eliminating the contact resistance between the fixed-end support and the specimen. The key to achieve a high resolution is to keep a constant resistance between the other end of the specimen contacting to the sliding probe. To achieve this objective, we have...
Sliding probe methods are designed for the in situ electrical property characterization of individual one-dimensional (1D) nanostructures by eliminating the contact resistance between the fixed-end support and the specimen. The key to achieve a high resolution is to keep a constant resistance between the other end of the specimen contacting to the sliding probe. To achieve this objective, we have...
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