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We investigate the dependence of electron beam induced current (EBIC) contrast from dark-line defects (DLDs) on temperature and voltage bias in failed and degraded high power quantum well laser diodes (HPLDs). Voltage bias induced contrast variations in EBIC allowed us to make the first observation of what may be the DLD initiation point in a degraded, but not failed, HPLD. Wavelet analysis of temperature...
We report our investigation of catastrophic optical damaged high power multi-mode InGaAs-AlGaAs strained quantum well (QW) lasers using electron beam induced current (EBIC), focused ion beam (FIB), and high-resolution transmission electron microscope (HR-TEM) techniques.
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