Search results for: L. Larcher
2013 IEEE International Reliability Physics Symposium (IRPS) > 5A.3.1 - 5A.3.8
2012 IEEE International Reliability Physics Symposium (IRPS) > 5D.3.1 - 5D.3.5
2010 International Electron Devices Meeting > 19.6.1 - 19.6.4
IEEE Electron Device Letters > 2010 > 31 > 9 > 1032 - 1034