Search results for: I. Guven
Microelectronics Reliability > 2011 > 51 > 12 > 2298-2305
Theoretical and Applied Fracture Mechanics > 2011 > 55 > 3 > 185-191
Materials Science & Engineering A > 2006 > 421 > 1-2 > 57-67
International Journal of Solids and Structures > 2001 > 38 > 50-51 > 9077-9109