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Field emission features and FIM/FEM images from vacuum arc-prepared carbon films on shape-controlled W tip apexes have been examined, where tens of samples with different film thicknesses and different radii were prepared. The obtained results imply that superior field emission is not due to the protrusions with high aspect ratio but its intrinsic nano-structures.
In this work, we used an ultrahigh vacuum (UHV) STM system with a surface treatment chamber where we prepare the carbon film by means of arc-discharge deposition of a high purity graphite rod under the same condition as in the case of the carbon coating that enhances FE characteristics. According to the STM geometrical images, the surface consists of graphite grains whose crystallinities and orientations...
In 1950, E. W. Miiller reported firstly the very feature cloverleaf patterns, which were able to be observed in field emission microscope (FEM) by using many kinds of adsorbed organic small molecules on tungsten tip. Since this discovery till now days, many papers have been reported and several theories have been proposed to explain about these phenomena. Also, relatively complicated total electron...
Nanometer-scale distributions of field emission current and local work function are compared on two contrasting systems. In the case of the graphene adsorbed on Pt(III) where the electronic structure is spatially perturbed, the electron emission current is higher at the sites with lower work functions. On the other hand, in the case of Ar ion-bombarded HfC thin films, the electron emission current...
A method to measure nanometer-scale distributions of field emission current is proposed where the tip-surface distance is controlled by the constant current STM operation and the emission current from the surface to the tip is measured at a sufficiently high bias voltage for a brief time under the feed back loop open. In the case of a monolayer graphite on Pt(111), where the electronic structure is...
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