The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
This focused section on optomechatronics is dedicated to recent advances in optomechatronic devices, systems, and metrology, aiming to stimulate future research in this direction. This editorial highlights papers related to this topic previously published in IEEE/ASME Transactions on Mechatronics and gives an overview to the six papers published in this focused section.
The DOF (depth of field) of an imaging system is closely related to the pupil function that describes the characteristics of the pupil such as size and shape. Shallow DOF is especially problematic in microscopic optical imaging systems because they have relatively large aperture size for high optical resolution. In this paper, a new DOF extension method is proposed. This is to acquire an image by...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.