Search results for: P. Fiala
Measurement > 2017 > 96 > C > 18-23
Microsystem Technologies > 2016 > 22 > 12 > 2783-2799
Microsystem Technologies > 2016 > 22 > 12 > 2765-2782
Advances in Engineering Software > 2014 > 75 > Complete > 101-112
Measurement > 2017 > 96 > C > 18-23
Microsystem Technologies > 2016 > 22 > 12 > 2783-2799
Microsystem Technologies > 2016 > 22 > 12 > 2765-2782
Advances in Engineering Software > 2014 > 75 > Complete > 101-112