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The paper presents a new power-aware test scheme compatible with a newly proposed test compression environment based on deterministic clustering of test cubes with conflicts. The key contribution is a flexible test application framework that achieves significant reductions in switching activity during scan loading by means of a tri-modal test data decompressor.
This paper presents a new and comprehensive low-power test scheme compatible with a test compression environment. The key contribution of this paper is a flexible test-application framework that achieves significant reductions in switching activity during all phases of scan test: loading, capture, and unloading. In particular, we introduce a new on-chip continuous-flow decompressor. Its synergistic...
This paper presents a new and comprehensive power-aware test scheme compatible with a test compression environment. The key contribution of the paper is a flexible test application framework that achieves significant reductions in switching activity during all phases of scan test: scan loading, unloading, and capture.
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