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Equivalence and dominance relations used earlier in fault diagnosis procedures are defined as relations between faults, similar to the relations used for fault collapsing. Since the basic entity of diagnostic fault simulation and test generation is a fault pair, and not a single fault, we introduce a framework where equivalence and dominance relations are defined for fault pairs. Using equivalence...
Existing diagnostic test generation procedures are output-independent, i.e., they attempt to distinguish faults on any output. We show that an output-dependent approach can facilitate diagnostic test generation and produce smaller diagnostic test sets for stuck-at faults in full-scan circuits. In the proposed output-dependent approach, the outputs of the circuit are considered one at a time. Faults...
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-cycle scan test patterns. A diagnostic test generation flow to speed up diagnosis is proposed to address the issue of long run times of test generation and large number of test patterns for the cases where the range of suspected...
We describe a diagnostic test generation procedure that targets the equivalence classes of the test set as it is being generated, instead of considering one fault pair at a time (an equivalence class contains faults that are indistinguished by the test set). When an equivalence class is targeted, all the fault pairs in the equivalence class are targeted simultaneously. This reduces the number of test...
We describe a diagnostic test generation procedure that deals with the large numbers of target fault pairs by considering subsets of faults. Each subset of faults is targeted separately during diagnostic test generation, and fault pairs are defined only out of the faults included in a subset. With M subsets of size K, the number of fault pairs considered is at most MK(K-1)/2 instead of N(N-1)/2 for...
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