The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
It was shown earlier that simulation of a transition fault under a test may indicate that the fault is detected by the test only if detection conditions referred to as hazard-based detection conditions are considered. The hazard-based detection conditions were applied to fault simulation and test generation for transition faults under scan-based tests. In this case, the increase in fault coverage...
Design-for-testability (DFT) approaches that allow a synchronous sequential circuit to enter states that it cannot enter during functional operation improve the fault coverage achievable for the circuit. However, nonfunctional operation during test application may result in switching activity that is significantly higher than under functional operation. This may lead to unnecessary yield loss due...
We propose a design-for-testability technique for synchronous sequential circuits called autoscan. Autoscan uses scan chains similar to conventional scan. However, it gives up the external scan inputs and outputs in order to eliminate the test data volume associated with them. Scan operations under autoscan improve the circuit testability by allowing the circuit state to be modified through shifting...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.