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As digital circuits grow in gate count so does the data volume required for manufacturing test. To address this problem several test compression techniques have been developed. This paper presents a novel and scalable technique for inserting observation points to aid compression by reducing pattern count and data volume. Experimental results presented for industrial circuits demonstrate the effectiveness...
Effect-cause diagnosis procedures are the most commonly used in industry to diagnose VLSI circuits that fail manufacturing test or field applications. Fast and effective diagnosis procedures are essential to diagnose large numbers of failing dies for yield ramp-up. We have recently proposed a method to speed up effect-cause diagnosis procedures by using a dictionary of small size [26]. In this paper...
Reducing power dissipation during test has been an active area of academic and industrial research for the last few years and numerous low-power DFT techniques and test generation procedures have been proposed. Segmented scan has been shown to be an effective technique in addressing test power issues in industrial designs. To achieve higher shipped product quality, tests for delay faults are becoming...
Reducing power dissipation during test has been an active area of academic and industrial research for the last few years and numerous low power DFT techniques and test generation procedures have been proposed. Segmented scan (Whetsel, 2000) and (Lee et al., 2004) has been shown to be an effective technique in addressing test power issues in industrial designs (Saxena et al., 2001). To achieve higher...
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