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Bridging and interconnect open faults are defined using subsets of lines. We study the possibility of identifying input vectors that are effective as test vectors for such faults without enumerating the faults. This process does not require accurate layout information, it can handle very large numbers of faults, and it deals with undetectable faults implicitly. We describe a static test compaction...
For fault models with large numbers of faults, such as bridging faults, fault collapsing based on dominance relations can be effective in reducing the test generation time by reducing the number of target faults. When dominance relations are used for fault collapsing, a fault fj is excluded from the set of target faults F if it dominates a fault fi in F. However, if fi remains undetected after test...
It was shown before that tests applied under nonfunctional operation conditions, which are made possible by scanning in an unreachable state, may lead to unnecessary yield loss. To address this issue, functional broadside tests were defined as broadside tests that use only reachable states of the circuit as scan-in states. Earlier procedures for generating functional broadside tests were not complete,...
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