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A recent approach to test generation avoids the assignment of certain input values in order not to prevent target faults from being detected. The test generation process based on this approach is efficient; however, it generates large test sets. We develop a dynamic test compaction procedure for this approach. Our goal is to reduce the test set size by increasing the number of faults detected by each...
Test generation procedures attempt to assign values to the inputs of a circuit so as to detect target faults. We investigate a complementary view whereby the goal is to avoid the assignment of certain input values in order not to prevent faults from being detected. We describe a procedure for computing input cubes (or incompletely specified input vectors) that should be avoided during test generation...
Test generation procedures attempt to assign values to the inputs of a circuit so as to detect target faults. We study a complementary view whereby the goal is to identify values that should not be assigned to inputs in order not to prevent faults from being detected. We describe a procedure for computing input cubes (or incompletely specified input vectors) that should be avoided during test generation...
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