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We describe a method for online testing of delay faults based on the comparison of output responses of identical circuits. The method allows one of the circuits to participate in useful computations during the testing process, while the other circuit must be idle. We refer to this method as semiconcurrent online testing. While unknown input vectors are applied to the circuit that participates in useful...
We describe a method for on-line testing of delay faults based on the comparison of output responses of identical circuits. The method allows one of the circuits to participate in useful computations during the testing process, while the other circuit must be idle. We refer to this method as semi-concurrent on-line testing. While unknown input vectors are applied to the circuit that participates in...
In this paper we investigate methods to detect delay faults in circuits that use standard scan design. We demonstrate that delay faults at several sites in a circuit cannot be detected using standard launch off capture and launch off shift tests that use two test cycles. However, faults at these sites are detectable using tests that use more than two test cycles. Experimental results on benchmark...
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