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Sliding probe methods are designed for the in situ characterization of electrical properties of individual 1-D nanostructures. The key to achieving a high resolution is to keep the contact resistance constant by controlling the contact force and area between the specimen and the sliding probe. We have developed several techniques and tools including differential sliding, flexible probes, and specimen-shape-adaptable...
Sliding probe methods are designed for the in situ electrical property characterization of individual one-dimensional (1D) nanostructures by eliminating the contact resistance between the fixed-end support and the specimen. The key to achieve a high resolution is to keep a constant resistance between the other end of the specimen contacting to the sliding probe. To achieve this objective, we have...
Sliding probe methods are designed for the in situ electrical property characterization of individual one-dimensional (1D) nanostructures by eliminating the contact resistance between the fixed-end support and the specimen. The key to achieve a high resolution is to keep a constant resistance between the other end of the specimen contacting to the sliding probe. To achieve this objective, we have...
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