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The paper presents a new channel allocation method for higher Embedded Deterministic Test (EDT) compression in SoC designs comprising isolated cores. It employs a test data reduction technique, which allows cores to interface with ATE through an optimized number of channels. This feature is subsequently used by a new test scheduling and test access mechanisms devised for both the input and output...
The presented compression scheme is a novel solution that is based on deterministic vector clustering and encompasses three data reduction features in one on-chip decoding system. The approach preserves all benefits of continuous flow decompression and offers compression ratios of order 1000x with encoding efficiency much higher than 1.00.
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