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Reducing IR-drop in the test cycle during at-speed scan testing has become mandatory for avoiding test-induced yield loss. An efficient approach for this purpose is post-ATPG test modification based on X-identification and X-filling since it causes no circuit/clock design change and no test vector count inflation. However, applying this approach to test compression has been considered challenging...
Capture-safety, defined as the avoidance of any timing error due to unduly high launch switching activity in capture mode during at-speed scan testing, is critical for avoiding test- induced yield loss. Although point techniques are available for reducing capture IR-drop, there is a lack of complete capture-safe test generation flows. The paper addresses this problem by proposing a novel and practical...
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