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Built-in-self-repair is an enabling approach for improving memory yield in system-on-chip designs. Reducing the overhead of repair circuits while minimizing the test and repair time is of prime importance. This article presents a fast parallel repair methodology for SoC memory cores and an associated automation framework.
Embedded memory plays an important role in modern system-on-chip designs. However, the reliability issue of embedded memories becomes more and more critical with the shrinking of transistor feature size. This paper proposes a programmable online/off-line built-in self-test (BIST) scheme for random access memories (RAMs) with error correction code (ECC). The BIST scheme can be used for performing production...
Embedded memories currently constitute a significant portion of the chip area for typical system-on-chip (SOC) designs. Built-in self-repair (BISR) techniques have been widely used for enhancing the yield of embedded memories. This paper proposes a shared parallel BISR scheme for random access memories (RAMs) in SOCs. The shared parallel BISR can test and repair multiple RAMs simultaneously. A global...
With the nano-scale technology, a system-on-chip (SOC) design may consist of many reusable cores from multiple sources. This causes the complexity of SOC testing is much higher than testing conventional VLSI chips. One of the test challenges of SOCs is test data reduction. This paper presents a multi-code compression (MCC) technique to reduce the volume of test data and the test application time....
With the nano-scale VLSI technology and system-on-chip (SOC) design methodology, the reliability has become one major challenge in SOCs. Especially, embedded memory cores heavily impact on the reliability of SOCs. Error detection and correction (EDAC) techniques are well-known methodologies for detecting and correcting soft errors of random access memories. However, conventional EDAC techniques cannot...
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