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Content addressable memory (CAM) is one key component in many digital systems. Although the CAM cell usually is implemented with RAM cell and comparison logic, the CAM testing is more difficult than the RAM testing. Also, the CAM testing is very different from the RAM testing. Most stuck-at faults (SAFs) in the RAM peripheral circuitry can be mapped to the RAM cell faults. This cannot be analogous...
This paper presents efficient testing methodologies for conditional sum adders. A conditional sum adder consists of conditional cells and selection cells. We propose a design-for-testability (DFT) technique to modify the conditional cells of a conditional sum adder. Then a test scheme is used for detecting the conditional sum adder with single cell fault model (CFM). The proposed test scheme only...
Diagnosis techniques are important for memory yield improvement. This paper presents an efficient diagnosis scheme for RAMs. The diagnosis scheme is composed of three March-based algorithms. A March-15N algorithm is used for locating and partially diagnosing faults of bit-oriented or word-oriented memories, where N represents the address number. Then a 3N March-like algorithm is used for locating...
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