Search results for: J. Sune
Microelectronics Reliability > 1997 > 37 > 10-11 > 1517-1520
Microelectronic Engineering > 1997 > 36 > 1-4 > 125-128
Solid State Electronics > 1996 > 39 > 12 > 1795-1804
Microelectronics Reliability > 1996 > 36 > 7-8 > 871-905
Solid State Communications > 1996 > 99 > 2 > 123-128
Solid State Communications > 1996 > 99 > 2 > 123-128
Applied Surface Science > 1996 > 102 > 255-258
Microelectronic Engineering > 1995 > 28 > 1-4 > 321-324
Microelectronics Reliability > 1995 > 35 > 3 > 539-553
ESSDERC '88: 18th European Solid State Device Research Conference > c4-783 - c4-786