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We describe the measurement of the noise of a 270-GHz low noise amplifier using wafer-probe techniques. The measurement includes deembedding to the coplanar waveguide input of the chip. The noise was measured at a variety of bias conditions and found to be a minimum of 7.5 dB. The gain of the chip is measured to be 11.4 dB, consistent with -parameter measurements of the same device. This is the highest...
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