Search results for: B. Tellini
Microelectronics Reliability > 2013 > 53 > 9-11 > 1676-1680
Measurement > 2013 > 46 > 3 > 1340-1348
International Journal of Hydrogen Energy > 2012 > 37 > 18 > 13462- 13469
IEEE Transactions on Plasma Science > 2011 > 39 > 1-1 > 59 - 64
IEEE Transactions on Plasma Science > 2011 > 39 > 1-1 > 22 - 28
IEEE Transactions on Instrumentation and Measurement > 2011 > 60 > 5 > 1893 - 1900
IEEE Transactions on Instrumentation and Measurement > 2011 > 60 > 2 > 625 - 632
Measurement > 2010 > 43 > 10 > 1683-1689
SPEEDAM 2010 > 1063 - 1068