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The single event effects hardening and heavy-ion testing of a radiation-hardened Flash-based field programmable gate array, RTG4, are presented. The hardened logic circuits include fabric flip-flops, fabric SRAM, global clocks, PLL, and SERDES. SEL is hardened for the whole chip. Lastly, the inspace programming is hardened as the consequence of the above hardening activities. Test results show the...
Heavy-ion beam is used to perform Single Event Effects testing on the Flash-based and radiation hardened FPGA, the RT4G150 device. Soft errors due to SEU and SET in the fabric Flip-Flops and PLL generated clocks are measured and analyzed. SEFIs in PLL and SERDES are also observed.
SET and SEFI characterization of the SmartFusion2 flash-based FPGA under heavy ion irradiation is presented. Functional blocks such as the PLL and Microcontroller Sub System are characterized and presented.
SmartFusion2 Flash-based Reprogrammable FPGAs are Neutron beam tested. Results confirm immunity of SEL and configuration upset with an elevated temperature approximately 95 ºC. SEU is discussed for the Fabric Logic, Global logic, SRAM, PLL and SEFI on the MSS.
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