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With the rapid development of IC design methods and manufacturing technologies, the scale of IC is becoming lager and lager, and the design method of system on chip (SoC) has been widely adopted. In the design process of SoC, the test problem is viewed as the bottleneck of the SoC development; and it is a challenge to test the IP (intellectual property) cores which are embedded deeply in the SoC especially...
With the increasing complexity and chip scale of SoC, the test problem is becoming more difficult and important. Adding DFT (design for testability) in SoC design period has become the main method for solving the test problem. Based on analyzing some common DFT structures such as Fscan-Bscan, Fscan-Tbus, and the standard for embedded core test (SECT) IEEE P1500, a system-level mixed DFT-TAM (test...
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