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We examined the structural properties and the electronic and magnetic structures of an Fe 3 O 4 ultrathin film prepared by oxidizing a low-temperature-grown (T=95K) Fe film on GaAs(100), using the X-ray diffraction, X-ray absorption spectroscopy, and X-ray magnetic circular dichroism measurements. They show no clear contrast to those of an Fe 3 O 4 film that was prepared...
The electronic structure of amorphous semiconductor InGaO 3 (ZnO) 0.5 thin films, which were deposited by radio-frequency magnetron sputtering process, was investigated using X-ray photoelectron spectroscopy and O K-edge X-ray absorption spectroscopy. The overall features of the valence and conduction bands were analyzed by comparing with the spectra of Ga 2 O 3 , In...
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