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When the author began his career as an analog test engineer in the semiconductor industry, testing was considered an annoying necessity. Today, test and assembly is the largest cost factor of a device, so it receives more attention, but is still a controversial subject. The author have encountered customers that feel some parameter testing takes too long, so they ignore the test altogether, even if...
Burn-in and the concomitant post-burn-in retest are significant cost adders to the overall IC manufacturing and test process. Methods to reduce burn-in capacity are continually sought. Traditional outlier screens such as fixed-limit analyses with parametric or non-parametric statistics, when applied to the newest technologies, result in excessive Type I or II errors which cannot be tolerated. In this...
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