Wyniki wyszukiwania dla: Kwang-Ting Cheng
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Typ publikacji
Słowa kluczowe
- AUTOMATIC TEST PATTERN GENERATION (16)
- LOGIC GATES (16)
- LOGIC TESTING (16)
- CIRCUIT FAULTS (15)
- INTEGRATED CIRCUIT TESTING (15)
- TESTING (14)
- FAULT DIAGNOSIS (11)
- CIRCUIT TESTING (10)
- INTEGRATED CIRCUIT DESIGN (10)
- CALIBRATION (8)
- DESIGN FOR TESTABILITY (8)
- FEATURE EXTRACTION (8)
- BUILT-IN SELF TEST (7)
- CMOS INTEGRATED CIRCUITS (7)
- DELAY (7)
- FAULT DETECTION (7)
- INTEGRATED CIRCUIT MODELING (7)
- RELIABILITY (7)
- CORRELATION (6)
- DECODING (6)
- FAULT SIMULATION (6)
- FLEXIBLE ELECTRONICS (6)
- INTEGRATED CIRCUIT RELIABILITY (6)
- INVERTERS (6)
- JITTER (6)
- MATHEMATICAL MODEL (6)
- SYSTEM-ON-A-CHIP (6)
- TIMING (6)
- TUNING (6)
- ACCURACY (5)
- ADAPTIVE EQUALISERS (5)
- ANALOGUE-DIGITAL CONVERSION (5)
- COMPUTATIONAL MODELING (5)
- DELAYS (5)
- ERROR STATISTICS (5)
- FAULT COVERAGE (5)
- MIXED ANALOGUE-DIGITAL INTEGRATED CIRCUITS (5)
- NOISE (5)
- ORGANIC THIN FILM TRANSISTORS (5)
- ROBUSTNESS (5)
- RUNTIME (5)
- SEMICONDUCTOR DEVICE MEASUREMENT (5)
- SILICON (5)
- SYSTEM-ON-CHIP (5)
- BIT ERROR RATE (4)
- CIRCUIT SIMULATION (4)
- CROSSTALK (4)
- DIGITAL CALIBRATION (4)
- EQUATIONS (4)
- FIELD PROGRAMMABLE GATE ARRAYS (4)
- FLIP-FLOPS (4)
- GENETIC ALGORITHM (4)
- GENETIC ALGORITHMS (4)
- GRAPHICS PROCESSING UNIT (4)
- HIGH-SPEED SERIAL LINKS (4)
- INTEGRATED CIRCUIT MODELLING (4)
- LOW-POWER ELECTRONICS (4)
- MANUFACTURING TESTING (4)
- MEMRISTOR (4)
- MICROPROCESSORS (4)
- MONITORING (4)
- POST-SILICON VALIDATION (4)
- RADIO FREQUENCY (4)
- RADIOFREQUENCY INTEGRATED CIRCUITS (4)
- SEQUENTIAL CIRCUITS (4)
- THIN FILM TRANSISTORS (4)
- TRANSCEIVERS (4)
- VLSI (4)
- WIRES (4)
- ADAPTIVE EQUALIZERS (3)
- ANALYTICAL MODELS (3)
- ARRAYS (3)
- BOOLEAN FUNCTIONS (3)
- BOOLEAN SATISFIABILITY (3)
- BUILT-IN SELF-TEST (3)
- CLOCKS (3)
- COMPACTION (3)
- COMPUTER ARCHITECTURE (3)
- COMPUTER BUGS (3)
- CONVERGENCE (3)
- DATA MINING (3)
- DEEP SUBMICRON DESIGNS (3)
- DESIGN-FOR-TESTABILITY (3)
- DIGITALLY-CALIBRATED PIPELINED ADC (3)
- ELECTROCARDIOGRAPHY (3)
- ENGINES (3)
- ERROR CORRECTION CODES (3)
- ESTIMATION (3)
- ESTIMATION ERROR (3)
- FACE RECOGNITION (3)
- HARDWARE (3)
- INTEGRATED CIRCUIT YIELD (3)
- KERNEL (3)
- LEAST SQUARES APPROXIMATION (3)
- LIBRARIES (3)
- LOGIC CIRCUIT TESTING (3)
- MANUFACTURING (3)
- MEASUREMENT (3)
- MEMRISTORS (3)
- MIXED-SIGNAL TESTING (3)
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Zbiór danych
Czasopismo
- IEEE Transactions on Very Large Scale Integration (VLSI) Systems (7)
- AT&T Technical Journal (2)
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2)
- Electronics Letters (1)
- IEEE/OSA Journal of Optical Communications and Networking (1)
- IEEE Design & Test of Computers (1)
- IEEE Electron Device Letters (1)
- IEEE Journal on Emerging and Selected Topics in Circuits and Systems (1)
- IEEE Transactions on Circuits and Systems I: Regular Papers (1)
- IEEE Transactions on Computers (1)
- IEEE Transactions on Electron Devices (1)
- IEEE Transactions on Multimedia (1)
- IEEE Transactions on Visualization and Computer Graphics (1)
- Journal of Display Technology (1)
- Journal of Electronic Testing (1)
- Journal of Lightwave Technology (1)
- Journal of the Society for Information Display (1)
- SID Symposium Digest of Technical Papers (1)
- więcej