Search results for: Y.-H. Lee
2016 IEEE International Electron Devices Meeting (IEDM) > 5.7.1 - 5.7.4
2015 IEEE International Electron Devices Meeting (IEDM) > 32.3.1 - 32.3.4
2015 IEEE International Reliability Physics Symposium > 6A.4.1 - 6A.4.5
2012 International Electron Devices Meeting > 4.6.1 - 4.6.4
2011 International Reliability Physics Symposium > 2A.4.1 - 2A.4.6