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Highly transparent conductive and near infrared (IR) reflective Gallium-doped ZnMgO (Zn 1−x Mg x O:Ga) films with Mg content from 0 to 10at% were deposited on glass substrate by DC reactive magnetron sputtering. X-ray diffraction shows all the ZnMgO:Ga films are polycrystalline and have wurtzite structure with a preferential c-axis orientation. Hall measurements indicate that...
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