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In this paper, thick film chip resistors with two different types of solder alloys namely SnPb and SnAgCu have been evaluated for the effects of the solder alloy elemental composition on the solder joint failures under cyclic temperature loading conditions. The creep properties of both solders have been modelled using the Garofalo equation and the creep strain energy density has been extracted and...
The paper describes experimental and finite element modelling (FEM) analyses on BGA assemblies under vibration tests. The purpose is to evaluate reinforcement methods of large BGA submitted to vibrations. Two techniques are used in this test: a cord of glue around the BGA (`peel off joint'), and gluing all the ball matrix of the second level of the BGA (Underfilling). Comparison between SnPb and SAC...
Power electronics uses semiconductor technology the convert and transmit energy. Power electronics modules such are the core electronic packages that undertake this function. The take up of these technologies is growing dramatically due to the increase in electronics in sectors such as automobiles, aerospace, consumer white goods, and of course green technologies. Designing such modules requires a...
This paper describes a physics of failure (PoF) based prognostic method for power electronic modules. This method allows the reliability performance of power modules to be assessed in real time. A compact thermal model was firstly constructed to investigate the relationship between the power dissipation and the temperature in the power module. Such relationship can be used for fast calculation of...
The article consists of a Powerpoint presentation on integrated reliability and prognostics prediction methodology for power electronic modules. The areas discussed include: power electronics flagship; design for reliability; IGBT module; design for manufacture; power module components; reliability prediction techniques; failure based reliability; etc.
A wide range of flip chip technologies with solder or adhesives have become dominant solutions for high density packaging applications due to the excellent electrical performance, high I/O density and good thermal performance. This paper discusses the use of modeling technique to predict the reliability of high density packaged flip chips in the humid environment. Reliability assessment is discussed...
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