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A technique has been developed that can measure the thickness of a 30–70nm thin film of cadmium sulfide on a Cu(In,Ga)Se 2 substrate, in real time, as it grows in a chemical bath. The technique does not damage the film, and can be used to monitor batch depositions and roll-to-roll depositions with equal accuracy. The technique is based on reflectance spectroscopy through the chemical bath.
Thin films of gadolinium oxide, gadolinium yttrium oxide, and gadolinium cerium oxide were electrodeposited from non-aqueous baths. The films were on the order of 15nm thick, and were grown epitaxially on textured nickel–tungsten substrates. The effect of deposition rate, annealing temperature and secondary metals on crystallinity and crystal orientation was investigated by X-ray diffraction and transmission...
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