Search results for: C.Q. Chen
International Journal of Energy Research > 42 > 13 > 4070 - 4084
Microelectronics Reliability > 2017 > 76-77 > C > 255-260
Microelectronics Reliability > 2017 > 76-77 > C > 141-144
Microelectronics Reliability > 2017 > 76-77 > C > 261-266
Microelectronics Journal > 2017 > 62 > C > 38-42
Science of The Total Environment > 2017 > 580 > C > 1175-1184
International Journal of Engineering Science > 2016 > 107 > C > 68-76
Microelectronics Reliability > 2016 > 64 > C > 362-366
Microelectronics Reliability > 2016 > 64 > C > 321-325
Microelectronics Reliability > 2016 > 64 > C > 317-320
Materials Science and Engineering: A > 2016 > 662 > C > 308-319
International Journal of Impact Engineering > 2015 > 83 > Complete > 47-58
Ultrasonics > 2015 > 55 > Complete > 42-47
Materials Science and Engineering: A > 2014 > 618 > C > 596-604
International Journal of Solids and Structures > 2014 > 51 > 10 > 1946-1953
Acta Materialia > 2014 > 69 > C > 114-125
Journal of Alloys and Compounds > 2014 > 590 > Complete > 1-4
Mechanics of Materials > 2014 > 70 > Complete > 33-40
Scripta Materialia > 2013 > 69 > 10 > 709-712
Materials Science & Engineering A > 2013 > 582 > Complete > 188-193