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We show different ways in which unused multiplexers (MUXes) and scan flip-flops (flops) in a structured application specific integrated chip (SA) design can be re-configured to insert test points to drastically reduce test volume and test generation time. We convert unused hardware in SAs into: (a) conventional control points, (b) complete test points, (c) pseudo-control points or (d) inversion test...
Since structured application specific integrated chip (ASIC) products require very short turn around time, long automatic test pattern generation (ATPG) run time is undesirable. Large structured ASICs often require a large number of test patterns to achieve the desired fault coverage. This paper presents the first test point insertion technique for structured ASICs that can reduce test set sizes and...
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