The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The anodic oxidation of InAlAs is investigated by transmission electron microscopy, Rutherford backscattering spectroscopy and medium energy ion scattering in order to elucidate the mechanism of oxide growth. For this purpose, anodizing was carried out at 5mAcm −2 in 0.1M sodium tungstate and 0.1M ammonium pentaborate electrolytes at 293K, which results in relatively efficient film growth...
Using medium energy ion scattering, combined with Rutherford backscattering spectroscopy, transmission electron microscopy and atomic force microscopy, the development of the copper-enriched alloy layer during anodizing of a sputtering-deposited Al-0.4at.% Cu alloy has been examined. The enriched layer is located just beneath the amorphous alumina film that is produced on the anodized alloy. Importantly...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.