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This paper describe the challenges of migrating the Cell Broadband Engine (Cell BE) design from a 65 nm SOI to a 45 nm twin-well CMOS technology on SOI with low-k dielectrics and copper metal layers using a mostly automated approach. A die micrograph of the 45 nm Cell BE is described here. The cycle-by-cycle machine behavior is preserved. The focuses are automated migration, power reduction, area...
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