Search results for: J. Chen
IEEE Electron Device Letters > 2018 > 39 > 1 > 59 - 62
2015 IEEE International Electron Devices Meeting (IEDM) > 35.3.1 - 35.3.4
IEEE Electron Device Letters > 2018 > 39 > 1 > 59 - 62
2015 IEEE International Electron Devices Meeting (IEDM) > 35.3.1 - 35.3.4