The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
A new process, based on the interaction between Si and N rich gas cluster and post Cu CMP features surface, was integrated in a multi-level Cu interconnect stack using 65 nm design rules. Using the same integration scheme as stand-alone SiCN dielectric capping, excellent electrical properties were achieved when the process was implemented with a USG layer on top of a porous Ultra-Low K. Furthermore,...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.