Search results for: C.H. Kim
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 4 > 537 - 556
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2008 > 16 > 4 > 456 - 465
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2008 > 16 > 3 > 249 - 262
2007 44th ACM/IEEE Design Automation Conference > 370 - 375
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2006 > 14 > 6 > 646 - 649