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In recent 3DIC studies, through silicon vias (TSV) are usually employed as the vertical interconnects in the 3D stack. Despite its benefit of short latency and low power, forming TSVs adds additional complexities to the fabrication process. Recently, inductive/capactive-coupling links are proposed to replace TSVs in 3D stacking because the fabrication complexities of them are lower. Although state-of-the-art...
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